Open Access
| Numéro |
EPJ Web Conf.
Volume 225, 2020
ANIMMA 2019 – Advancements in Nuclear Instrumentation Measurement Methods and their Applications
|
|
|---|---|---|
| Numéro d'article | 01010 | |
| Nombre de pages | 4 | |
| Section | Fundamental Physics | |
| DOI | https://doi.org/10.1051/epjconf/202022501010 | |
| Publié en ligne | 20 janvier 2020 | |
- A. Aguilar-Arevalo et al., “Measurement of radioactive contamination in the high-resistivity silicon CCDs of the DAMIC experiment,” J. Instrum., vol. 10, no. 08, pp. P08014–P08014, Aug. 2015. [Google Scholar]
- J. Estrada, J. Molina, J. J. Blostein, and G. Fernández, “Plasma effect in silicon charge coupled devices (CCDs),” Nucl. Instruments Methods Phys. Res. Sect. A Accel. Spectrometers, Detect. Assoc. Equip., vol. 665, pp. 90–93, 2011. [CrossRef] [Google Scholar]
- R. Newton, J. Dykes, M. J. Scott, and M. J. Joyce, “Alpha contamination assay, dosimetry and spectrometry using charge coupled devices,” 2016 IEEE Nucl. Sci. Symp. Med. Imaging Conf. Room-Temperature Semicond. Detect. Work. NSS/MIC/RTSD 2016, vol. 2017–Janua, 2017. [Google Scholar]
- R. Newton, M. J. Scott, and M. J. Joyce, “Investigating Artifacts Associated with beta-Particle Interactions in Charge-Coupled Devices,” … J. Mod. Phys. Conf. Ser., vol. 1, no. 1, pp. 1–5, 2010. [Google Scholar]
- G. R. Hopkinson and A. Mohammadzadeh, “Comparison of CCD Damage Due to 10- and 60-MeV Protons,” IEEE Trans. Nucl. Sci., vol. 50, no. 6 I, pp. 1960–1967, 2003. [Google Scholar]