A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton IrradiationLaurent A. Francis, Amor Sedki, Nicolas André, Valéria Kilchytska, Pierre Gérard, Zeeshan Ali, Florin Udrea et Denis FlandreEPJ Web Conf., 170 (2018) 01006DOI: https://doi.org/10.1051/epjconf/201817001006
